Deep Ultraviolet Polarization
McPherson
This novel instrument measures optical reflectance as a function of angle of incidence. It can help determine optical constants. It is specially built to work with non-polarized light in the 30-160 nanometer wavelength region. This new twist from McPherson helps users test materials, multilayers and coatings “at wavelength" for applications like attosecond spectroscopy and HHG, optical design for space applications, wavelength calibration, and thin-film / coating technique design This new twist helps users test materials, multilayers and coatings at wavelength in applications like attosecond spectroscopy, HHG, optical design for space applications, wavelength calibration, and thin-film / coating technique design.
*Manufacturer's specifications subject to change without notice.