Imaging spectrometer for vacuum ultraviolet (VUV)
McPherson
With a carefully adjusted aperture in the optical path, McPHERSON spectrometers now measure vertical spatial profile in addition to dispersed wavelengths. They operate in the vacuum ultraviolet (VUV) and can, for example, view plasma impurity emission lines in the wavelength range of 30 to 320 nanometers. The three meter system reports: Simultaneous wavelengths measured in a single discharge, about 3.7nm. With entrance slit width 0.02-millimeters, users can achieve 15.3-picometer spectral resolution FWHM. The vertical observation range is tailored to different heights with a convex mirror. Doing so enables edge profile measurement and full profile measurements that cover entire vertical plasma.
*Manufacturer's specifications subject to change without notice.