XFPA-1.7-640-LN2 - SWIR detector

Xenics Nv

The XFPA-1.7-640-LN2 SWIR detector excels in performance for any R&D spectroscopy or semiconductor failure analysis task. As these applications focus on measuring very low light levels, they require infrared detectors with extremely low dark current and noise levels. The XFPA-1.7-640-LN2 InGaAs detector is optimized for operation at 77K, using Liquid Nitrogen (LN2) cooling, and achieves ultra-low noise levels (15 e-). Additionally, a very low dark current (less than 5e-/pixel) allows you to integrate for several hours. The detector has a resolution of 640 x 512 pixels, 20 μm pixel pitch and a maximum full frame rate of 2.5 Hz.

*Manufacturer's specifications subject to change without notice.

Xenics designs and markets infrared imagers, cores and cameras of best-in-class image quality to support innovative R&D, industrial automation, machine vision, process control and high-end security applications. The company offers a complete portfolio of line-scan and 2-D area-scan products for the VisNIR, SWIR, MWIR and LWIR ranges.
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